Characterization and Control of Interfaces for High Quality Advanced Materials III
| By: | Kevin Ewsuk; Makio Naito; Tomoyuki Kakeshita; Soshu Kirihara; Keizo Uematsu; Hiroya Abe |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9780470909171 |
| eText ISBN: | 9780470917138 |
| Edition: | 1 |
| Format: | Page Fidelity |
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