Data-driven Methods for Fault Detection and Diagnosis in Chemical Processes
| By: | Evan L. Russell; Leo H. Chiang; Richard D. Braatz |
| Publisher: | Springer Nature |
| Print ISBN: | 9781852332587 |
| eText ISBN: | 9781447104094 |
| Edition: | 0 |
| Format: | Page Fidelity |
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