Back to results
Cover image for book Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

By:Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Lin
Publisher:Springer Nature
Print ISBN:9781461349693
eText ISBN:9781461502159
Edition:3
Format:Page Fidelity

eBook Features

Instant Access

Purchase and read your book immediately

Read Offline

Access your eTextbook anytime and anywhere

Study Tools

Built-in study tools like highlights and more

Read Aloud

Listen and follow along as Bookshelf reads to you